Surface Characterization Center of Solid State Institute
Academic supervisor: Prof. Dudi Gershoni, dg@physics.technion.ac.il
Center managers:
Dr. Kamira Weinfeld, kamira@si.technion.ac.il, Phone : 04 -829-3148/5638
Dr. Cecile Saguy, cecile@sspower.technion.ac.il, Phone: 04 -829-3928 / 4611
STM/AFM - Scanning Tunneling/Atomic Force Microscopy (Omicron UHV SPM)
TOF-SIMS- Time of Flight Secondary Ion Mass Spectrometry (Ion ToF TOF-SIMA V)
XPS - X-ray Photoelectron Spectroscopy (Thermo VG Scientific Sigma Probe)