Contact:
Dr. Cecile Saguy
Tel: +972-4-829-3547
e-mail: cecile@si.technion.ac.il
The Laboratory is based on an Omicron Variable Temperature Ultra High Vacuum Scanning Probe Microscope system, purchased in 2005. It includes an Atomic Force Microscope (AFM) and a Scanning Tunneling Microscope (STM)
The key features are:
- True sub-pA scanning tunneling microscopy and spectroscopy (STS)
- STS down to atomic scale - True atomic resolution imaging in contact AFM mode
- Topography and Current mapping in contact AFM mode
- Non-contact AFM mode in frequency modulation regime and new PLL electronics
- Scanning Kelvin Probe Microscopy (SKPM) in frequency modulation regime
- In situ Auger electron spectroscopy (AES),
- In situ low energy electron diffraction (LEED), - In situ cleavage,
- In situ Ar sputtering,
- In situ metal evaporation and In situ H2 cracker
- Gate valve for analysis and preparation chamber isolation
- AFM beam deflection
- Direct and radiation sample heating up to 1500K
- In situ cooling and heating down to 25K and up to 1500K
- Scan size from sub-nano to 8 µm
