Faculty of Materials Science & Engineering
The center includes a top-of-the-line Transmission Electron Microscope (TEM) (0.07 nm resolution), an additional conventional TEM, a high resolution Scanning Electron Microscope (HRSEM) , an environmental SEM (ESEM) and advanced facilities for sample preparation, including a Dual Focused Ion Beam (FIB) system.
Academic supervisor: Prof. Wayne D, Kaplan, Kaplan@technion.ac.il
Center manager: Dr. Yaron Kauffmann, mtyaron@tx.technion.ac.il, Phone : 04 -829-4567
Dr. Popilevsky Larisa (managing the FIB), slotus@campus.technion.ac.il, Phone : 04 -829-5144
List of Equipment:
Microscopes
High Resolution Transmisson Electron Microscope - FEI Titan 80-300 kV FEG-S/TEM
Transmission Electron Microscope - FEI Tecnai G2 T20 S-Twin TEM
Dual beam Focused Ion Beam (FIB) - Dual beam FIB - Helios nano-lab G3 FEI
High-Resolution Scanning electron microscope - Zeiss Ultra-Plus FEG-SEM with a heating stage
Scanning Electron Microscope - FEI Quanta 200 E-SEM
Light Microscope - Olympus BX51 Light Microscope
Electron Microscopy Specimen preparation Lab:
Plasma Cleaner - Fischione plasma cleaner – model 1020
Gold & Carbon Coating - Quorum Q150T Turbo-Pumped Sputter Coater/Carbon Coater and Polaron gold coater
Low energy Ion Miller - IV8 Gentle Mill (Technoorg Linda Ltd., Hungary)
Ultra Microtom - Reichert-Yung Ultracut E
Electropolisher - Struers Tenupol-5
PIPS - Gatan 691 Precision Ion Polishing System