Nano Area
Faculty
Ph.D.: Physics Institute, Riga, Latvia, 1979
M.Sc.: Moscow Institute of Physics and Technology, Russia, 1973
Main Nano Field:
Characterization of nanoscale materials and materials systems by x-ray diffraction techniques and development of new characterization techniques.
Research Interests:
Static and dynamic strain fields in thin crystalline layers
Structural defects in electronic and optoelectronic materials
Structure and microstructure of biogenic crystals
Domains in ferroelectric thin films
Fast x-ray diffraction and imaging
Development of energy-variable x-ray diffraction for studying polycrystalline materials with high depth resolution
High-resolution x-ray diffraction measurements and simulations in multilayers and superlattices