Emil Zolotoyabko

Ph.D.: Physics Institute, Riga, Latvia, 1979

M.Sc.: Moscow Institute of Physics and Technology, Russia, 1973

Main Nano Field:

Characterization of nanoscale materials and materials systems by x-ray diffraction techniques and development of new characterization techniques.

Research Interests:

Static and dynamic strain fields in thin crystalline layers

Structural defects in electronic and optoelectronic materials

Structure and microstructure of biogenic crystals

Domains in ferroelectric thin films

Fast x-ray diffraction and imaging

Development of energy-variable x-ray diffraction for studying polycrystalline materials with high depth resolution

High-resolution x-ray diffraction measurements and simulations in multilayers and superlattices