Surface Characterization Center

Surface Characterization Center

Solid State Institute

Academic supervisor: Prof. Dudi Gershoni, dg@physics.technion.ac.il

Center managers:

Dr. Kamira Weinfeld, kamira@si.technion.ac.il, Phone : 04 -829-3148/5638 

Dr. Cecile Saguy, cecile@sspower.technion.ac.il, Phone: 04 -829-3928 / 4611

List of equipment:

Ion Implantation (HVEE 320 KeV Ion Implanter)

STM/AFM - Scanning Tunneling/Atomic Force Microscopy (Omicron UHV SPM)

Kelvin prop force microscopy

TOF-SIMS- Time of Flight Secondary Ion Mass Spectrometry (Ion ToF TOF-SIMA V)

XPS - X-ray Photoelectron Spectroscopy (Thermo VG Scientific Sigma Probe)

HR XRD - High Resolution X-ray Diffraction (Philips- Four Crystal Diffractometer) 

NSOM/AFM - Near-field Scanning optical/Atomic force Microscopy